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Effects of bulk and interface scattering on giant magnetoresistance in the Co/Cu multilayer systems

Identifieur interne : 000641 ( Main/Exploration ); précédent : 000640; suivant : 000642

Effects of bulk and interface scattering on giant magnetoresistance in the Co/Cu multilayer systems

Auteurs : B. Elsafi [Tunisie] ; F. Trigui [Tunisie] ; Z. Fakhfakh [Tunisie]

Source :

RBID : Pascal:11-0033771

Descripteurs français

English descriptors

Abstract

The evolution of the giant magnetoresistance (GMR) effect in thin film multilayers based on (Co/Cu)n has been investigated by using semi-classical approach of the two spin channel currents developed by Hood, Falicov and Penn. The in plane MR of Co/Cu multilayers is calculated for correlated quasiperiodic interfaces. The numerical results show important influence of interface roughness on the behaviour of MR. The variation of MR with phenomenological parameters S↑ and S↓ for two directions of spin and relaxation time is reported. This interface roughness has been successfully included in our GMR simulation using a semi-classical description to analyse the experimental results giving the variation of MR with the thickness of the copper interlayer.


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<term>Temps relaxation</term>
<term>Epaisseur</term>
<term>Cuivre</term>
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<term>Couche mince</term>
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